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Hommel Etamic’s W 600 Series Contour and Roughness Measurement System

Hommel Etamic’s W 600 Series Contour and Roughness Measurement System

The new W612 measuring station features a Modular probe and system software with the capability to measure a resolution of 1nm with a TKU400 probing system.  All Digiscan probe arms utilize a magnetically attached kinematic mounted coupling that enables quick probe system changeover with minimum retooling time due to automatic probe recognition. The Digiscan probe arms are equipped with an RFID chip for simple calibration and automatic configuration. Read more